In the News

New Award: Best Paper at 2010 ACM/IEEE Design Automation Conference

June 22, 2010

My colleague Prof. Xin Li (CMU) and our student Wangyang Zhang (CMU) and I have been awarded the 2010 DAC Best Paper award for the paper “Bayesian Virtual Probe: Minimizing Variation Characterization Cost for Nanoscale IC Technologies Via Bayesian Inference.” The paper developed a new methodology to adaptively characterize process variation of silicon wafers from a minimum set of measurement data.  This year, 10 papers out of the 608 submitted were nominated for the Best Paper Award, and the DAC Award Committee selected one winner from the final group of 10.

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